Chip package and manufacturing method thereof

ABSTRACT

A chip package includes a substrate having an upper and a lower surface and including: at least a first contact pad; a non-optical sensor chip disposed overlying the upper surface, wherein the non-optical sensor chip includes at least a second contact pad and has a first length; a protective cap disposed overlying the non-optical sensor chip, wherein the protective cap has a second length, an extending direction of the second length is substantially parallel to that of the first length, and the second length is shorter than the first length; an IC chip disposed overlying the protective cap, wherein the IC chip includes at least a third contact pad and has a third length, and an extending direction of the third length is substantially parallel to that of the first length; and bonding wires forming electrical connections between the substrate, the non-optical sensor chip, and the IC chip.

CROSS REFERENCE

This Application claims the benefit of U.S. Provisional Application No.61/265,277, filed on Nov. 30, 2009, the entirety of which isincorporated by reference herein.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a chip package, and in particularrelates to a chip package of a non-optical sensor chip.

2. Description of the Related Art

Electronic products are developed to be lighter, thinner, shorter, andsmaller. Semiconductor chips now tend to consist of multi-chip packagesto achieve multi-functional and high performance requirements. Amulti-chip package includes a variety of chips, such as logic chips, ananalog chip, control chips, or memory chips which are all integratedinto a single chip package.

For example, for conventional technology, a micro electro-mechanicalsystem sensor chip (MEMS sensor chip) and an application specificintegrated circuit (ASIC) are commonly integrated together on a printedcircuit board.

However, when more chips are integrated together, the size of thepackage cannot be reduced effectively if the chips are integratedtwo-dimensionally on a package substrate. Too much area of the packagesubstrate is occupied such that manufacturing cost is increased, whichadversely affects applications in portable electronic products.

BRIEF SUMMARY OF THE INVENTION

According to an embodiment of the invention, a chip package is provided.The chip package includes a substrate having an upper surface and alower surface, wherein the substrate includes at least a first contactpad; a non-optical sensor chip disposed overlying the upper surface ofthe substrate, wherein the non-optical sensor chip comprises at least asecond contact pad and has a first length; a protective cap disposedoverlying the non-optical sensor chip, wherein the protective cap has asecond length, an extending direction of the second length issubstantially parallel to an extending direction of the first length,and the second length is shorter than the first length; an IC chipdisposed overlying the protective cap, wherein the IC chip comprises atleast a third contact pad and has a third length, and an extendingdirection of the third length is substantially parallel to the extendingdirection of the first length; and a plurality of bonding wires formingelectrical connections between the substrate, the non-optical sensorchip, and the IC chip.

According to an illustrative embodiment, a method for forming a chippackage is provided. The method includes: providing a substrate havingan upper surface and a lower surface, wherein the substrate comprises atleast a first contact pad; disposing a non-optical sensor chip overlyingthe upper surface of the substrate, wherein the non-optical sensor chipcomprises at least a second contact pad and has a first length;disposing a protective cap overlying the non-optical sensor chip,wherein the protective cap has a second length, an extending directionof the second length is substantially parallel to an extending directionof the first length, and the second length is shorter than the firstlength; disposing an IC chip overlying the protective cap, wherein theIC chip comprises at least a third contact pad, the IC chip has a thirdlength, and an extending direction of the third length is substantiallyparallel to the extending direction of the first length; and forming aplurality of bonding wires, wherein the bonding wires form electricalconnections between the substrate, the non-optical sensor chip, and theIC chip.

According to an illustrative embodiment, a method for forming a chippackage is provided. The method includes: providing a substrate, whereinthe substrate comprises at least a first contact pad; providing asemiconductor wafer comprising a plurality of non-optical sensor chips,wherein each of the non-optical sensor chips comprises at least a secondcontact pad, and each of the non-optical sensor chips has a firstlength; disposing a plurality of protective caps overlying thesemiconductor wafer, wherein the protective caps are disposed overlyingat least one of the non-optical sensor chips, respectively, each of theprotective caps has a second length, an extending direction of thesecond length is substantially parallel to an extending direction of thefirst length, and the second length is shorter than the first length;disposing a plurality of IC chips overlying the semiconductor wafer,wherein the IC chips are disposed overlying one of the protective caps,respectively, each of the IC chips comprises at least a third contactpads and has a third length, and an extending direction of the thirdlength is substantially parallel to the extending direction of the firstlength; dicing the semiconductor wafer to separate the non-opticalsensor chips; disposing one of the separated non-optical sensor chipsoverlying the substrate; and forming a plurality of bonding wires,wherein the bonding wires form electrical connections between thesubstrate, the separated non-optical sensor chip, and the IC chip.

According to an illustrative embodiment, a method for forming a chippackage is provided. The method includes: providing a substrate, whereinthe substrate comprises at least a first contact pad; providing asemiconductor wafer comprising a plurality of non-optical sensor chips,wherein each of the non-optical sensor chips comprises at least a secondcontact pad, and each of the non-optical sensor chips has a firstlength; disposing a plurality of protective caps overlying thesemiconductor wafer, wherein the protective caps are disposed overlyingat least one of the non-optical sensor chips, respectively, each of theprotective caps has a second length, an extending direction of thesecond length is substantially parallel to an extending direction of thefirst length, and the second length is shorter than the first length;dicing the semiconductor wafer to separate the non-optical sensor chips;disposing an IC chip overlying one of the non-optical sensor chips,wherein the IC chip is disposed overlying the protective cap of one ofthe separated non-optical sensor chips, the IC chip comprises at least athird contact pad and has a third length, and an extending direction ofthe third length is substantially parallel to the extending direction ofthe first length; disposing one of the separated non-optical sensorchips overlying the substrate; and forming a plurality of bonding wires,wherein the bonding wires form electrical connections between thesubstrate, the separated non-optical sensor chip, and the IC chip.

A detailed description is given in the following embodiments withreference to the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention can be more fully understood by reading thesubsequent detailed description and examples with references made to theaccompanying drawings, wherein:

FIG. 1 is a cross-sectional view showing a chip package according to anembodiment of the present invention;

FIG. 2 is a cross-sectional view showing a chip package according to anembodiment of the present invention;

FIG. 3 is a cross-sectional view showing a chip package according to anembodiment of the present invention;

FIG. 4 is a cross-sectional view showing a chip package according to anembodiment of the present invention;

FIG. 5 is a cross-sectional view showing a chip package according to anembodiment of the present invention;

FIGS. 6A-6C are cross-sectional views showing the steps of forming achip package according to an embodiment of the present invention; and

FIGS. 7A-7C are cross-sectional views showing the steps of forming achip package according to an embodiment of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

The following description is of the best-contemplated mode of carryingout the invention. This description is made for the purpose ofillustrating the general principles of the invention and should not betaken in a limiting sense. The scope of the invention is best determinedby reference to the appended claims.

It is understood, that the following disclosure provides many differentembodiments, or examples, for implementing different features of theinvention. Specific examples of components and arrangements aredescribed below to simplify the present disclosure. These are, ofcourse, merely examples and are not intended to be limiting. Inaddition, the present disclosure may repeat reference numbers and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.Furthermore, descriptions of a first layer “on,” “overlying,” (and likedescriptions) a second layer include embodiments where the first andsecond layers are in direct contact and those where one or more layersare interposing the first and second layers.

FIG. 1 is a cross-sectional view showing a chip package 10 according toan embodiment of the present invention. In this embodiment, the chippackage 10 includes a substrate 100 which has an upper surface 100 a andan opposite lower surface 100 b. The substrate 100 may include asemiconductor material, ceramic material, polymer material, orcombinations thereof. In one embodiment, the substrate 100 is a printedcircuit board. The substrate 100 further includes at least a firstcontact pad 102 for receiving or transmitting electrical signals.

As shown in FIG. 1, the chip package 10 further includes a non-opticalsensor chip 104 disposed overlying the upper surface 100 a of thesubstrate 100. The non-optical sensor chip 104 includes at least asecond contact pad 106 for receiving or transmitting electrical signals.For example, a conducting route between the first contact pad 102 andthe second contact pad 106 may be achieved by a bonding wire such thatelectrical signals may be transmitted between the non-optical sensorchip 104 and the substrate 100 (such as a printed circuit board). Inthis embodiment, the non-optical sensor chip 104 has a first length L1.

The non-optical sensor chip 104 includes any sensor chip which is notapplied to the receiving or emitting of light. For example, thenon-optical sensor chip 104 may be a MEMS sensor chip. In addition, thenon-optical sensor chip 104 may include a micro fluidic system chip,physical sensor chip for detecting physical changes such as detectingheat, light, or pressure, RF device chip, accelerator chip, gyroscopechip, micro actuator chip, surface acoustic wave device chip, orpressure sensor chip. However, it should be noted that an optical chipmay be adopted to replace the non-optical sensor chip 104 depending onrequirement. For example, an image capture chip, light emitting chip, orsolar cell chip may be disposed overlying the substrate 100.

As shown in FIG. 1, a protective cap 108 is disposed overlying thenon-optical sensor chip 104 to protect the non-optical sensor chip 104from being damaged. The protective cap 108 has a second length L2. Theextending direction of the second length L2 is substantially parallel tothe extending direction of the first length L1 of the non-optical sensorchip 104. The second length L2 needs to be shorter than the first lengthL1. In this embodiment, because the second length L2 is shorter than thefirst length L1, the protective cap 108 is prevented from covering thecontact pad 106 on the non-optical sensor chip 104 to adversely affectthe subsequent formation of a bonding wire. However, it is not necessaryfor the protective cap to be completely shorter than the non-opticalsensor chip 104. The protective cap 108 only needs to be shorter thanthe non-optical sensor chip 104 along the extending directionsubstantially parallel to the first length L1. The portion of theprotective pad 108 that does not cover the contact pad 106 may have asize longer than the non-optical sensor chip 104, depending onrequirement.

The material of the protective cap 108 may be, for example, a glassmaterial, metal material, ceramic material, polymer material,semiconductor material, or combinations thereof. In this embodiment, theprotective cap 108 is disposed overlying the non-optical sensor chip 104through a spacer structure 109. The protective cap 108, the spacerstructure 109, and the non-optical sensor chip 104 together surround asealed space. In one embodiment, a portion of the non-optical sensorchip 104 may operate within the sealed space. The material of the spacerstructure 109 may include a glass material, metal material, ceramicmaterial, polymer material, semiconductor material, or combinationsthereof. The spacer structure 109 may be fixed between the protectivecap 108 and the non-optical sensor chip 104 by an adhesion layer.Alternatively, the spacer structure 109 may be adhesive. For example,the spacer structure 109 may be an adhesive polymer. In addition, acuring process may be performed to harden the adhesive polymer spacerstructure 109. For example, the spacer structure 109 may be cured byheating or irradiation with a light.

As shown in FIG. 1, the chip package 10 further includes an IC chip 110disposed overlying the protective cap 108. The IC chip 110 has at leasta third contact pad 112 for receiving or transmitting electricalsignals. For example, a conducting route between the first contact pad102 and the third contact pad 112 may be achieved by a bonding wire suchthat electrical signals may be transmitted between the non-opticalsensor chip 104 and the substrate 100 (such as a printed circuit board).Alternatively, a conducting route between the second contact pad 106 andthe third contact pad 112 may be achieved by a bonding wire such thatelectrical signals may be transmitted between the non-optical sensorchip 104 and the substrate 100 (such as a printed circuit board). Inthis embodiment, the IC chip 110 has a third length L3. In thisembodiment, the extending direction of the third length L3 issubstantially parallel to the extending direction of the first length L1of the non-optical sensor chip 104. The third length L3 is shorter thanthe first length L1. The IC chip 110 includes, for example, an ASIC chipused to process electrical signals input to and/or output from thenon-optical sensor chip 104 and/or the substrate (such as a printedcircuit board).

The chip package 10 shown in FIG. 1 includes a plurality of bondingwires 114, wherein the bonding wires 114 a electrically contact one ofthe first contact pads 102 and one of the third contact pads 112,respectively. The bonding wires 114 b electrically contact one of thesecond contact pads 106 and one of the third contact pads 112,respectively. The material of the bonding wires 114 may include a metalmaterial, such as gold, copper, aluminum, or combinations thereof. Thebonding wires 114 may be formed using typical wire bonding process. Inone embodiment, the chip package 10 may be disposed overlying anotherelectronic device through a soldering ball 116 providing a desiredelectrical connection.

FIG. 2 is a cross-sectional view showing a chip package 20 according toanother embodiment of the present invention, wherein same or similarreference numbers are used to designate same or similar elements. Thechip package 20 has a structure similar to that of the chip package 10.The main difference therebetween is that the chip package 20 furtherincludes a bonding wire 114 c which electrically contacts the one of thefirst contact pads 102 and one of the second contact pads 106,respectively. The bonding wire 114 c may be used to transmit electricalsignals between the substrate (such as a printed circuit board) and thenon-optical sensor chip 104.

In the embodiments shown in FIGS. 1 and 2, each of the third lengths L3of the IC chips 110 is shorter than each of the first lengths L1 of thenon-optical sensor chips 104. However, embodiments of the presentinvention are not limited thereto. In another embodiment, the thirdlength L3 of the IC chip may be longer than or equal to the first lengthL1 of the non-optical sensor chip 104, such as the embodiments shown inFIGS. 3 and 4.

FIG. 3 is a cross-sectional view showing a chip package 30 according toan embodiment of the present invention, wherein the chip package 30 hasa structure similar to that of the chip package 10 or 20. In thisembodiment, the third length L3 of the IC chip 110 is longer than thefirst length L1 of the non-optical sensor chip 104. Because the thirdlength L3 is longer than the first length L1, no bonding wire can beformed between the second contact pad 106 and the third contact pad 112,unlike the embodiment shown in FIG. 1 or 2. In this case, in order toensure that electrical signals can be transmitted between the IC chip110 and the non-optical sensor chip 104 smoothly, electrical connectionsto the substrate 100 may be achieved first through the bonding wires 114b and 114 c, respectively. Then, electrical signals are transmitted toeach other through different contact pads in the substrate 100.

In addition, in one embodiment of the invention, the third length L3 ofthe IC chip 110 may be substantially equal to the first length L1 of thenon-optical sensor chip 104, such as that shown in the cross-sectionalview of a chip package 40 in FIG. 4, wherein same or similar referencenumbers are used to designate same or similar elements. In this case,electrical connections to the substrate 100 may also be achieved firstthrough the bonding wires 114 b and 114 c, respectively. Then,electrical signals are transmitted to each other through differentcontact pads in the substrate 100.

In addition, in another embodiment of the invention, the locations ofthe non-optical sensor chip 104 and the IC chip 110 may be exchanged, asthat shown in the cross-sectional view of a chip package 50 in FIG. 5.As shown in FIG. 5, the IC chip 110 is disposed between the non-opticalsensor chip 104 and the substrate 100. In this case, the third length L3of the IC chip 110 needs to be longer than the first length L1 of thenon-optical sensor chip 104.

A method for forming a chip package 10 according to an embodiment of theinvention will be described with references made to FIG. 1. The chippackages 20, 30, and 40 shown in FIGS. 2-4 may be formed by a similarmethod. First, a substrate 100 having an upper surface 100 a and a lowersurface 100 b is provided. The substrate 100 includes at least a firstcontact pad 102. Then, a non-optical sensor chip 104 is disposedoverlying the upper surface 100 a of the substrate 100, wherein thenon-optical sensor chip 104 includes at least a second contact pad 106and has a first length L1. Then, a protective cap 108 is disposedoverlying the non-optical sensor chip 104. The protective cap 108 has asecond length L2, wherein the extending direction of the second lengthL2 is substantially parallel to the extending direction of the firstlength L1. The second length L2 is shorter than the first length L1.Then, an IC chip 110 is disposed overlying the protective cap 108. TheIC chip 110 includes at least a third contact pad 112 and has a thirdlength L3. The extending direction of the third length L3 issubstantially parallel to the extending direction of the first lengthL1. Then, a plurality of bonding wires 114 are formed, which formelectrical connections between the substrate 100, the non-optical sensorchip 104, and the IC chip 110.

In one embodiment, after the substrate 100, the non-optical sensor chip104, the protective cap 108, and the IC chip 110 are disposed, thedesired bonding wires 114 are formed on the contact pads of thesubstrate 100, the non-optical sensor chip 104, and the IC chip 110through, for example, a wire bonding process. However, embodiments ofthe present invention are not limited thereto. In another embodiment,the bonding wires are formed stepwise to form electrical connectionsbetween different chips or between chips and the substrate. Take theembodiment shown in FIG. 3 as an example, before disposing the IC chip110, a terminal of the bonding wire 114 a is first electricallyconnected to one of the first contact pads 102. After the IC chip 110 isdisposed thereon, the other terminal of the bonding wire 114 a iselectrically connected to one of the third contact pads 112.

In addition, it is preferable that the chip package according to anembodiment of the invention is formed by a wafer-level packaging toreduce manufacturing time and cost and increase product yields. FIGS.6A-6C are cross-sectional views showing the steps of forming a chippackage according to an embodiment of the present invention, whereinsame or similar reference numbers are used to designate same or similarelements.

As shown in FIG. 6A, a semiconductor wafer 600 is first provided, whichincludes a plurality of non-optical sensor chips 104. Each of thenon-optical sensor chips 104 includes at least a second contact pad 106,and each of the non-optical sensor chips 104 has a first length L1.

Then, as shown in FIG. 6B, a plurality of protective caps 108 aredisposed overlying the semiconductor wafer 600. For example, theprotective caps 108 are respectively disposed overlying at least one ofthe non-optical sensor chips 104 through spacer structures 109. Each ofthe protective caps 108 has a second length L2. The extending directionof the second length L2 is substantially parallel to the extendingdirection of the first length L1. The second length L2 is shorter thanthe first length L1.

Still referring to FIG. 6B, a plurality of IC chips 110 are thendisposed overlying the semiconductor wafer 600. The IC chips 110 aredisposed overlying one of the protective caps 108, respectively. Each ofthe IC chips 110 includes at least a third contact pad (not shown, tosee the third contact pad 112 in FIG. 1, for example) and has a thirdlength L3. The extending direction of the third length L3 issubstantially parallel to the extending direction of the first lengthL1. In this embodiment, the third length L3 is shorter than the firstlength L1. However, in another embodiment, the third length L3 is longerthan or equal to the first length L1 (such as that shown in FIG. 3 or4).

Then, the semiconductor wafer 600 may be diced along predeterminedscribe lines SC in FIG. 6B to separate the non-optical sensor chips 104.In addition, before or after the non-optical sensor chips 104 areseparated, the semiconductor wafer 600 may be optionally grinded toremove excess portion of the semiconductor wafer 600. The obtainedseparated non-optical sensor chips 104 are shown in FIG. 6C.

A following process is described with references made to FIG. 1. Asubstrate 100 is provided. The substrate 100 includes at least a firstcontact pad 102. One of the separated non-optical sensor chips 104 (suchas that shown in FIG. 6C) is disposed overlying the substrate 100. Aplurality of bonding wires 114 are formed. The bonding wires 114 formelectrical connections between the substrate 100, one of the separatednon-optical sensor chips 104, and the IC chip 110. As shown in FIG. 1, asoldering ball 116 may be formed overlying the lower surface 100 b ofthe substrate 100. In addition, it should be noted that the separatednon-optical sensor chips 104 obtained in FIG. 6C may not only bepackaged through the method shown in FIG. 1, but also may be packagedthrough any one of the methods shown in FIGS. 2-4.

In the embodiment shown in FIGS. 6A-6C, the protective caps 108 and theIC chips 110 are disposed in a wafer-level packaging process. Theplurality of protective caps 108 and the plurality of IC chips 110 maybe stacked overlying the semiconductor wafer 600 in a single disposingprocess, respectively; thus reducing manufacturing time and cost.

FIGS. 7A-7C are cross-sectional views showing the steps of forming achip package according to an embodiment of the present invention.Similar to the embodiment shown in FIGS. 6A-6C, the embodiment shown inFIGS. 7A-7C also adopts a wafer-level packaging, wherein same or similarreference numbers are used to designate same or similar elements.

As shown in FIG. 7A, a semiconductor wafer 700 is provided, whichincludes a plurality of non-optical sensor chips 104. Each of thenon-optical sensor chips 104 includes at least a second contact pad 106.Each of the non-optical sensor chips 104 has a first length L1.

Then, as shown in FIG. 7B, a plurality of protective caps 108 aredisposed overlying the semiconductor wafer 700. For example, theprotective caps 108 are respectively disposed overlying at least one ofthe non-optical sensor chips 104 through spacer structures 109. Each ofthe protective caps 108 has a second length L2. The extending directionof the second length L2 is substantially parallel to the extendingdirection of the first length L1. The second length L2 is shorter thanthe first length L1.

Then, the semiconductor wafer 700 is diced along predetermined scribelines SC in FIG. 7B to separate the non-optical sensor chips 104. Inaddition, before or after the non-optical sensor chips 104 areseparated, the semiconductor wafer 700 may be optionally ? to removeexcess semiconductor wafer 700. The obtained separated non-opticalsensor chips 104 are shown in FIG. 7C.

A following process is described with references made to FIG. 1. An ICchip 110 is disposed overlying one of the separated non-optical sensorchips 104 (such as that shown in FIG. 7C). The IC chip 110 is disposedoverlying the protective cap 108 of one of the separated non-opticalsensor chips 104. The IC chip 110 includes at least a third contact pad112 and has a third length L3. The extending direction of the thirdlength L3 is substantially parallel to the extending direction of thefirst length L1. In this embodiment, the third length L3 is shorter thanthe first length L1. However, in another embodiment, the third length L3is longer than or equal to the first length L1 (such as that shown inFIG. 3 or 4).

Then, a substrate 100 is provided. The substrate 100 includes at least afirst contact pad 102. One of the separated non-optical sensor chips 104is disposed overlying the substrate 100. A plurality of bonding wires114 are formed. The bonding wires 114 form electrical connectionsbetween the substrate 100, one of the separated non-optical sensor chips104, and the IC chip 110. As shown in FIG. 1, a soldering ball 116 maybe formed overlying the lower surface 100 b of the substrate 100. Inaddition, it should be noted that the separated non-optical sensor chips104 obtained in FIG. 7C may not only be packaged through the methodshown in FIG. 1, but also may be packaged through any one of the methodsshown in FIGS. 2-4.

By stacking the sensor chips and the IC chips and forming conductingroutes between the sensor chips and the IC chips by bonding wires, areaof the package substrate of the chip packages of the embodiment of theinvention may be reduced, which benefit application in portableelectronic products.

While the invention has been described by way of example and in terms ofthe preferred embodiments, it is to be understood that the invention isnot limited to the disclosed embodiments. To the contrary, it isintended to cover various modifications and similar arrangements (aswould be apparent to those skilled in the art). Therefore, the scope ofthe appended claims should be accorded the broadest interpretation so asto encompass all such modifications and similar arrangements.

1-10. (canceled)
 11. A method for forming a chip package, comprising:providing a substrate having an upper surface and a lower surface,wherein the substrate comprises at least a first contact pad; disposinga non-optical sensor chip overlying the upper surface of the substrate,wherein the non-optical sensor chip comprises at least a second contactpad and has a first length; disposing a protective cap overlying thenon-optical sensor chip, wherein the protective cap has a second length,an extending direction of the second length is substantially parallel toan extending direction of the first length, and the second length isshorter than the first length; disposing an IC chip overlying theprotective cap, wherein the IC chip comprises at least a third contactpad, the IC chip has a third length, and an extending direction of thethird length is substantially parallel to the extending direction of thefirst length; and forming a plurality of bonding wires, wherein thebonding wires form electrical connections between the substrate, thenon-optical sensor chip, and the IC chip.
 12. The method for forming achip package as claimed in claim 11, wherein the third length of the ICchip is shorter than the first length of the non-optical sensor chip.13. The method for forming a chip package as claimed in claim 12,wherein one of the bonding wires electrically contacts one of the firstcontact pads and one of the third contact pads.
 14. The method forforming a chip package as claimed in claim 12, wherein one of thebonding wires electrically contacts one of the second contact pads andone of the third contact pads.
 15. The method for forming a chip packageas claimed in claim 12, wherein one of the bonding wires electricallycontacts one of the first contact pads and one of the second contactpads.
 16. The method for forming a chip package as claimed in claim 1,wherein the third length of the IC chip is longer than or equal to thefirst length of the non-optical sensor chip.
 17. The method for forminga chip package as claimed in claim 16, wherein one of the bonding wireselectrically contacts one of the first contact pads and one of the thirdcontact pads.
 18. The method for forming a chip package as claimed inclaim 16, wherein before the IC chip is disposed, one terminal of one ofthe bonding wires is electrically connected to one of the first contactpads, and after the IC chip is disposed, another terminal of the one ofthe bonding wires is electrically connected to one of the third contactpads.
 19. The method for forming a chip package as claimed in claim 16,wherein one of the bonding wires electrically contacts one of the secondcontact pads and one of the third contact pads.
 20. A method for forminga chip package, comprising: providing a substrate, wherein the substratecomprises at least a first contact pad; providing a semiconductor wafercomprising a plurality of non-optical sensor chips, wherein each of thenon-optical sensor chips comprises at least a second contact pad, andeach of the non-optical sensor chips has a first length; disposing aplurality of protective caps overlying the semiconductor wafer, whereinthe protective caps are disposed overlying at least one of thenon-optical sensor chips, respectively, each of the protective caps hasa second length, an extending direction of the second length issubstantially parallel to an extending direction of the first length,and the second length is shorter than the first length; disposing aplurality of IC chips overlying the semiconductor wafer, wherein the ICchips are disposed overlying one of the protective caps, respectively,each of the IC chips comprises at least a third contact pads and has athird length, and an extending direction of the third length issubstantially parallel to the extending direction of the first length;dicing the semiconductor wafer to separate the non-optical sensor chips;disposing one of the separated non-optical sensor chips overlying thesubstrate; and forming a plurality of bonding wires, wherein the bondingwires form electrical connections between the substrate, the separatednon-optical sensor chip, and the IC chip.
 21. A method for forming achip package, comprising: providing a substrate, wherein the substratecomprises at least a first contact pad; providing a semiconductor wafercomprising a plurality of non-optical sensor chips, wherein each of thenon-optical sensor chips comprises at least a second contact pad, andeach of the non-optical sensor chips has a first length; disposing aplurality of protective caps overlying the semiconductor wafer, whereinthe protective caps are disposed overlying at least one of thenon-optical sensor chips, respectively, each of the protective caps hasa second length, an extending direction of the second length issubstantially parallel to an extending direction of the first length,and the second length is shorter than the first length; dicing thesemiconductor wafer to separate the non-optical sensor chips; disposingan IC chip overlying one of the non-optical sensor chips, wherein the ICchip is disposed overlying the protective cap of one of the separatednon-optical sensor chips, the IC chip comprises at least a third contactpad and has a third length, and an extending direction of the thirdlength is substantially parallel to the extending direction of the firstlength; disposing one of the separated non-optical sensor chipsoverlying the substrate; and forming a plurality of bonding wires,wherein the bonding wires form electrical connections between thesubstrate, the separated non-optical sensor chip, and the IC chip.